This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Electronic properties of pulsed laser deposited, nanoscale CeNi5 alloy layers, on a dielectric substrate are described using the complex dielectric function. This spectral behavior is studied separately for the real part ε1 (the dielectric constant or dielectric permittivity) and imaginary part ε2 (the dielectric loss function) of this function. The layers were obtained from grinded bulk powder [1] using short, modulated laser pulses [2]. The XRD pattern of the bulk was used for structural determinations and phase quality check. The absolute reflectance of the obtained alloy was determined at the 632.8 nm laser wavelength, of a liquid nitrogen cooled and stabilized He-Ne source, which. This value was further used to renormalize the relative differential reflectance spectroscopy measurements from the UV-Vis-NIR domain. The final absolute reflectance spectra, over the above-mentioned domain, was processed using the Krames-Kronig formalism [3, 4], so that the two parts of the complex dielectric function were computed. The behavior of the displayed spectral inflexion points, studied using appropriate theoretical considerations, explains the variation of the dielectric functions. This way one determined the electron energy density functions and the shape of the energy bands together with their variation with the layer thickness and deposition substrate.
CeNi5 nanoscale films, UV-Vis-NIR specular reflectance spectroscopy, Kramers-Kronig formalism, electronic energy bands
The statements, opinions and data contained in the journal are solely those of the individual authors and contributors and not of the publisher and the editor(s). We stay neutral with regard to jurisdictional claims in published maps and institutional affiliations.
